Showing results: 1876 - 1890 of 4500 items found.
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7750TG -
Evertz Microsystems Ltd.
The 7750TG Test Signal Generator provides a cost effective method of generating SDTV 270Mb/s test signals. The 7750TG is ideal for checking signal path integrity, monitor alignment or to determine system performance over varying cable lengths. The 7750TG generates test signals in 525 line and 625 line SMPTE 259M-C video formats and offers four 270Mb/s outputs.
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Magnetic Analysis Corp
Accurate handling, conveying and positioning of material, before, during and after the test is a critical part of any NDT system. MAC’s mechanical handling products, the result of many years of experience with actual NDT installations, help to ensure accuracy and successful test results. Standard and custom-designed options are available, plus “V” Roll and Constant Center Triple Guide Roll Test Benches.
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TS8996 -
Rohde & Schwarz GmbH & Co. KG
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Rapita Systems Ltd.
Our engineering solutions support the development of safety-critical embedded systems. We support systems, hardware and software engineering, software V&V including multicore timing analysis, the development of efficient automated test environments, and develop custom tools to meet verification needs.
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SemiProbe
Built using our PS4L patented technology, SemiProbe manufactures a family of Vacuum Probing Systems, which test wafers or substrates in a vacuum environment. Additionally, individual die and broken/partial wafers can be tested with the Vacuum Probing System. All key modules are interchangeable and upgradeable.
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TRIO-TECH International
The COBIS-II Series Burn-in System is designed to test the latest high frequency integrated circuits (ICs) and combines a large capacity oven with well proven Accutron FlexBID™ dynamic driver technology. This system is engineered for productive dynamic device testing and reliable monitoring.
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Power Diagnostix Systems GmbH
This group of instruments offer partial discharge measurement functions of different performance level. Devices for test and research laboratories as well as systems for on-site PD analysis are available. Stand alone units, computer controlled systems or wireless operating acquisition sets are shown in this area.
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RAM-TEST-FIXTURE -
The Modal Shop, Inc.
The NDT Test Station, Model RAM-TEST-FIXTURE Resonant Inspection System is an ideal choice for testing when repeatable manual inspections are required. The innovative Test Station allows precise control of part positioning with an adjustable table ranging up to 6.25 inches (158.75 mm) in height.
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CELL03 -
SDi
SDi offers a wide range of alarm component test tools to compliment our detector test equipment. These tools include devices for testing auxiliary components of alarm systems, such as batteries and audible appliances, as well testing solutions for more specialized fire detectors, such as duct and flame detectors.
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TEM -
Mess- & Prüfsysteme GmbH
Partial discharge test system for laboratory or on-site measurement according to VDE 0434, IEC 60270 and EN50178 consisting of:*Partial discharge meter TMG*High-voltage coupling capacitors for decoupling of the PD pulses*Partial discharge calibrator TPK for determining the correction factor in the PD test circuit
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Shenzhen UYIGAO Electronic Technology Co., Ltd
UYIGAO DC electronic loads provide you with the flexibility to test a wide range of power sources. Perform both static and dynamic tests to ensure that your devices can handle the steady state and occasional transient loads. The 16-bit voltage, current, and power-measurement systems provide accuracy analysis.
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ERAVANT
SA full noise figure and gain test extender that extends the noise and gain measurement capabilities of common and low frequency signal synthesizers and noise figure meters to the frequency range of 110 to 170 GHz. This extender is designed to interface with industry standard noise and gain test systems.
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YAV90PIN -
6TL Engineering
The YAV90PIN board is designed to cover the need to control the available power supplies in a test system to the device under test. A VPC 90 series connector is used as interface with the fixture, guaranteeing more than 20.000 mating cycles. Two connector contacts per relay contact are used.
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Keysight Technologies
Keysight DC electronic loads provide you with the flexibility to test a wide range of applications from power-supply test to simulation of high-intensity discharge (HID) headlamps. The 16-bit voltage, current and power-measurement system provides both accuracy and convenience, and eliminates the need for a DMM, external shunts and wiring.
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TA-5 -
Tech-Aid Products
A complete NAV/LOC/GS/MKR test panel designed around the VIR30/31/32 units. Requires channeling source. Combining the TA-6 panel provides a complete integrated system.